【CD74ACT00M96 Logic - Gates and Inverters TI】Electronic Components In Stock Suppliers in 2018【Price】【Datasheet PDF】USA

Electronic Component Parts in 2018Electronic Components Industry ServicesInductorsIntegrated CircuitsMagnets & HeadsManufacturing SuppliesModulesMotors & ElectromechanicalsOptoelectronic ComponentsOptoelectronic DisplaysPlugs & SocketsPower Supplies, Batteries & AccessoriesPrinted Circuit BoardsQuartz Crystal/Quartz OscillatorsRelays & KeyboardsResistorsElectronic ComponentsAcoustic ComponentsCapacitorsCircuit & Heat Protection DevicesCoilsConnectorsDiodes & TransistorsSensorsNews in 2018
Hong Kong Inventory Limited
You Are Here: Home > Stock Trading Center > Product (Page: 4037) > CD74ACT00M96
Search
4031     4032     4033     4034     4035     

4036     4037     4038     4039     4040     
The following offer records may have been changed. To search for latest offer, please click Get Latest Offer
Part Number:

CD74ACT00M96

Catagory:

Integrated Circuits (ICs) > Logic - Gates and Inverters

Brand:

Texas Instruments

Description:

IC GATE NAND 4CH 2-INP 14-SOIC

Series:

74ACT

Packaging:

Cut Tape (CT)

Logic Type:

NAND Gate

Number of Circuits:

4

Number of Inputs:

2

Features:

-

Voltage - Supply:

4.5 V ~ 5.5 V

Current - Quiescent (Max):

4µA

Current - Output High, Low:

24mA, 24mA

Logic Level - Low:

0.8V

Logic Level - High:

2V

Max Propagation Delay @ V, Max CL:

13.2ns @ 5V, 50pF

Operating Temperature:

-55°C ~ 125°C

Mounting Type:

Surface Mount

Supplier Device Package:

14-SOIC

Package / Case:

14-SOIC (0.154", 3.90mm Width)

CD74ACT00M96 Description

IC GATE NAND 4CH 2-INP 14-SOIC Series: 74ACT Logic Type: NAND Gate Number of Circuits: 4 Number of Inputs: 2 Features: - Voltage - Supply: 4.5 V ~ 5.5 V Current - Quiescent (Max): 4米A Current - Output High, Low: 24mA, 24mA Logic Level - Low: 0.8V Logic Level - High: 2V Max Propagation Delay @ V, Max CL: 13.2ns @ 5V, 50pF Operating Temperature: -55~C ~ 125~C Mounting Type: Surface Mount Supplier Device Package: 14-SOIC Package / Case: 14-SOIC (0.154, 3.90mm Width)
1 - 5 of 5 Record(s)
CD74ACT00M96
 Part NumberBrandD/CQtyCompany

CD74ACT00M96

TI5000SUNTOP SEMICONDUCTOR CO., LIMITED    3

CD74ACT00M96

TI11+466Ande Electronics Co., Limited    12
Warranty

CD74ACT00M96

T.I6225C & I Semiconductors Co., Limited    8

CD74ACT00M96

TI0410466Dan-Mar Components Inc.   11

CD74ACT00M96
 

HARRIS16+2134HY(HK) Ic Limited    8

Related Part Number

CD74ACT00ME4 | CD74ACT02M | CD74ACT00E | CD74ACT00M | CD74ACT00ME4 | CD74ACT02M | CD74ACT02M96 | CD74ACT04E | CD74ACT04M | CD74ACT04M96 | CD74ACT05E
CD74ACT00M96 Ref.:
[hkinbatch20180720]
[HGCacheDateZOIBIOIB]
[HGReferer_STC_Overview]
[HKIN20180420GESTYLE]
[HKIN20171020MDPartDetails]

CD74ACT00M96 Related Keywords in 2018 USA

Use Escrow services to protect yourself from on-line scams. Please also stay updated on fraud alerts with our list of Reported Companies. As a buyer, you can access to a huge database providing information of obsolete and hard-to-find parts in passive and active components, ICs, semiconductors, and more. To help minimize fraudulent activities online, we would like to encourage our members to use our Escrow service, which significantly reduces the risk of fraud. We are now pleased to launch a special Escrow Fee promotion. You may now search through our membership database with an email address. Authenticate HKI members before dealing with them. You may find the "HKinventory Member Search" link in the footer on our homepage. Trial Membership is suitable for new user to try out HKin.com services before registering as a member.
Wiring accessories Coaxial cables Automobile plug-in cables Bonding wire Cable ties/restrainers Copper wire Fiber-optic cables Flat ribbon cables General-purpose wire LAN cable assemblies Magnet wire Optical fiber Telephone cards Wire hamesses Wire cable Hard ferrite magnets Audio magnetic heads Card reader magnetic heads Floppy disk magnetic heads Hard disk magnetic heads Video magnetic heads Alinco Magnets Plastic magnets Printer heads
Cached Page: 9e/65[Testing]